Entry Date:
January 22, 2019

GaN HEMT Track-and-Hold Sampling Circuits with Digital Post-Correction on Dynamic Nonlinearity for High-Performance ADCs

Principal Investigator Tomas Palacios

Co-investigator Hae-Seung (Harry) Lee


Analog-to-digital converters (ADCs) often limit the performance of integrated systems for emerging ap- plications such as next-generation communication systems, data centers, and quantum computing. The ADC performance is, in turn, limited at least partly by a track-and-hold sampling circuit (THSC). The low supply voltage of deeply scaled complementary metal-oxide-semiconductor (CMOS) transistors determines the THSC input signal range, therefore becoming a fun- damental upper bound to the effective number of bits (ENOBs) of CMOS ADCs.

This research work envisions to realize THSCs in GaN-on-Si technology, which monolithically integrates GaN high-electron-mobility transistors (HEMTs) with Si-CMOS transistors, for future ultrahigh- performance ADCs. Operating GaN HEMTs at a high voltage (>30 V) allows a very large input swing (>16 V), providing signal-to-noise ratio (SNR) performance orders of magnitudes beyond the limit of CMOS THSCs. We designed and implemented two GaN HEMT THSCs. The first THSC was fabricated in a commercial GaN foundry technology on SiC substrate, providing 98-dB SNR at 200 MS/s. The second THSC design was fabricated in a GaN technology that was developed at MTL on Si substrate, which operates at 1 GS/s thanks to a higher current-gain cutoff frequency fT and external gate-bootstrapping clock . While these GaN HEMT THSCs achieved an unprecedentedly high SNR at a given input frequency, they suffer from dynamic nonlinearity from the GaN HEMT source- follower buffers for gate-bootstrapping sampling clock generation. Although dynamic nonlinearity correction techniques are mature with RF power amplifiers (PAs), these conventional pre-distortion techniques have high sensitivity to DC offsets, and thus, cannot be directly applied to GaN HEMT THSCs.

To overcome this challenge, we are developing a digital post-correction (DPC) technique, which will demonstrate improved linearity of GaN HEMT THSCs without using a dedicated reference ADC. By applying a DPC technique based on modified Volterra series, we have recently demonstrated that THSC linearity can be improved by more than 20 dB. We are presently working to enhance the linearization performance by applying advanced DPC techniques.