Prof. James M LeBeau
Associate Professor of Materials Science and Engineering
Co-Director for Characterization.nano
Primary DLC
Department of Materials Science and Engineering
MIT Room:
8-203
Areas of Interest and Expertise
Ceramics
Electronic Materials
Energy Storage
Nanotechnology
Structural Materials
Surfaces
Interfaces
Ferroelectrics/Piezoelectrics (FE Memory, Transducers)
Structural Materials (Novel Metal Alloys)
Nanoscale/2D Materials
Quantum Properties (Qubits)
Failure Analysis (Failure Modes in Materials)
Informing Process Development (Thin Film Growth)
Machine Learning to Accelerate Characterization
Electronic Materials
Energy Storage
Nanotechnology
Structural Materials
Surfaces
Interfaces
Ferroelectrics/Piezoelectrics (FE Memory, Transducers)
Structural Materials (Novel Metal Alloys)
Nanoscale/2D Materials
Quantum Properties (Qubits)
Failure Analysis (Failure Modes in Materials)
Informing Process Development (Thin Film Growth)
Machine Learning to Accelerate Characterization
Research Summary
LeBeau Group : As scaling continues to be a major drive of research, future developments rely upon electron microscopy to probe the nature of material properties. In the nano-regime, one must explore local atomic structure, chemical composition, and bonding with ultimate spatial resolution. Now that aberration corrected microscopes have blown past the Ångström in resolution, a new level of clarity is available for exploring next-generation materials.
Research interests focus on applying and developing transmission electron microscopy techniques to determine the atomic structure of material defects, thus providing insight into observed properties. This is of particular importance as electronic devices scale to ever vanishingly small dimensions, when the detailed arrangement of atoms at interfaces begins to critically influence material properties.
Research interests focus on applying and developing transmission electron microscopy techniques to determine the atomic structure of material defects, thus providing insight into observed properties. This is of particular importance as electronic devices scale to ever vanishingly small dimensions, when the detailed arrangement of atoms at interfaces begins to critically influence material properties.
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Projects
September 1, 2020Department of Materials Science and Engineering
Quantitative Electron Microscopy
Principal Investigator James LeBeau
September 1, 2020Department of Materials Science and EngineeringPhonon Band Structure
Principal Investigator James LeBeau
September 1, 2020Department of Materials Science and EngineeringMagnetism in Oxide Thin Films
Principal Investigator James LeBeau
September 1, 2020Department of Materials Science and EngineeringAutomating Scanning Transmission Electron Microscopy
Principal Investigator James LeBeau