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3296 search results found
  • May 27, 2015
    Department of Chemistry

    Cysteine Arylation

    Principal Investigator Brad Pentelute

  • October 1, 2008

    How to Have Influence

  • 2024 MIT R&D Conference: Track 5 - AI - The Road to Digital Twins in Semiconductor Manufacturing

    November 19, 2024Conference Video Duration: 25:26
    The Road to Digital Twins in Semiconductor Manufacturing
    Duane Boning
    MIT Vice Provost for International Activities (VPIA)
    Associate Director, Microsystems Technology Laboratories (MTL)
    Clarence J. LeBel Professor, MIT Electrical Engineering and Computer Science (EECS)

    There is great interest in “digital twins” to improve many aspects of semiconductor manufacturing, from increased device yield and performance, reduced consumption of energy and materials, increased flexibility, and to enable rapid uptake and scaling of new material, equipment, and process innovations. The digital twin has both physical and virtual components, with bilateral communication and control; the hope is to enable a wide range of models (of equipment, processes, wafers) at different fidelities (physical to simplified empirical, and machine-learning enabled), to support a wide range of “smart” functionalities. The road to digital twins goes through and builds upon many well-trodden paths. Here, several lines of research at MTL since the late 1980’s are highlighted, beginning with elements of the MIT Computer Aided Fabrication Environment including process flow languages, to DOE/Opt methods for automated surrogate model construction, and run by run control to track and compensate for equipment state and wear in CMP and other unit processes. The development of “statistical metrology” methods encompassed characterization and modeling of semiconductor variation, with layout pattern dependent models to identify “hot spots” in planarization, dishing, and erosion for a given design, as well as to guide dummy fill generation. An evolution from statistical to ML/AI approaches, particularly Bayesian methods, enabled design for manufacturability (DFM) for rapid MOSFET characterization, and then rapid fabrication process tuning, as well as AI-enabled anomaly detection. These and other paths bring us to an exciting next stage of the journey: by harnessing advances in sensing and data collection, AI methods, and computational power not possible at the beginning, the community is poised to create and deploy digital twins for semiconductor manufacturing.

  • 10.16.20-Oncology-Round-table

    October 16, 2020Conference Video Duration: 76:35

    Single-cell mass as a clinical tool for guiding treatment decisions

    Keith Ligon
    Associate Professor of Pathology at Harvard Medical School
    Scott Manalis
    Andrew and Erna Viterbi Professor of Biological Engineering
    Clifford Reid
    CEO of Travera
     

  • July 13, 2011
    Department of Biological Engineering

    Regulatory Networks Utilizing Protein-Protein Interactions

    Principal Investigator Ron Weiss

  • Eric
    A
    von Hippel

    T Wilson (1953) Professor of Management
    Primary DLC
    MIT Sloan School of Management

    Contact

    MIT Room
    E62-464
    Phone
    (617) 253-7155
    evhippel@mit.edu

    Assistant

    Assistant Name
    Ryan Harrington
    Assistant phone number
    (617) 715-5675
    ryanharr@mit.edu
  • Andrew
    W
    Lo

    Charles E and Susan T Harris Professor of Finance
    Primary DLC
    MIT Sloan School of Management

    Contact

    MIT Room
    E62-618
    Phone
    (617) 253-0920
    alo@mit.edu

    Assistant

    Assistant Name
    Kate Lyons
    Assistant phone number
    (617) 715-4840
    klyons1@mit.edu
  • April 1, 2022

    MIT Climate Grand Challenge Initiative

    Principal Investigator Yuly Fuentes-Medel

  • 2.23.21-AI-Benjamin

    February 23, 2021Conference Video Duration: 20:34

    Michael Benjamin
    Research Scientist, Mechanical Engineering

  • Robert
    A
    Simcoe

    Francis L Friedman Professor of Physics
    Primary DLC
    Department of Physics

    Contact

    MIT Room
    37-241
    Phone
    (617) 324-0542
    simcoe@space.mit.edu

    Assistant

    Assistant Name
    Debbie Meinbresse
    Assistant phone number
    (617) 253-1456
    meinbres@mit.edu

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