High Speed Atomic Force Microscopy

Atomic force microscope(AFM) is a powerful and versatile instrument with a wide variety of applications ranging from imaging and nano-manipulation to characterizing mechanical properties of various types of samples. The speed limitations of this device however, have constrained its capabilities. In this research we develop controls, instrumentation and signal processing techniques to achieve ultra-high imaging speed for AFM and unlock its true ability. The new possibilities made available through the contributions of this research will be explored in areas such as materials, and biological sciences.