Project Website http://3doptics.mit.edu/website/research/vh-ti/
Combining work done on VHM and the TIE, we are able to make quantitative phase measurements in a VHM system from it’s intensity sub-images. Each sub-image is an intensity measurement at a different z plane. And therefore, VHM systems with many focal planes are able to capture large intensity data sets in a single-shot, which can be used with higher order TIE to recover higher-order accuracy phase results.