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Prof. Roy E Welsch
Eastman Kodak Leaders for Global Operations Professor of Statistics and Management Science
Professor of Statistics and Engineering Systems
Director, Center for Computational Research in Economics and Management Science (CCREMS)
Primary DLC
MIT Sloan School of Management
MIT Room:
E62-564
(617) 253-6601
rwelsch@mit.edu
http://mitsloan.mit.edu/faculty/directory/roy-e-welsch
Assistant
Natalie Jean
(617) 253-2650
njean91@mit.edu
Areas of Interest and Expertise
Corporate Strategy and Policy (Risk Management)
Credit Cards
Experimental Design
Financial Engineering (Financial Econometrics)
Information Technology
Managerial Economics (Econometrics)
Neural Networks
Operations Management (Quality, Process Control)
Operations Research (Data Acquisition, Data Mining)
Risk Investment
Statistics (Bayesian Statistics, Sampling)
Center for Computational Research in Economics and Management Science (CCREMS)
Management Science (MS)
Research Summary
Professor Welsch is an authority in data mining, statistical software, sampling, design of experiments, financial engineering, and process control, Roy Welsch is the person to contact. An expert in applied statistical methodology in manufacturing, e-business, and finance,Welsch develops statistical models relating process inputs to product outputs in semiconductor, film, and paper manufacturing. He also looks at hybrid process control, credit card scoring models, data mining for the analysis of massive data sets, robust methods and design, value-at-risk models, and optimization for financial time series
Recent Work
Projects
July 1, 2020
Abdul Latif Jameel Clinic for Machine Learning in Health (J-Clinic)
Harnessing Signals of Clinical Effectiveness from Electronic Health Records (EHR) Data to Repurpose Existing Drugs for Unmet Medical Needs
Principal Investigator
Roy Welsch
July 18, 2008
MIT Sloan School of Management
Advanced Computational Image Analysis
Principal Investigator
Roy Welsch
March 23, 2004
MIT Sloan School of Management
Gene and Protein Microarray Analysis
Principal Investigator
Roy Welsch
March 3, 2004
MIT Sloan School of Management
Robust Statistical Analysis for Optical Imaging
Principal Investigator
Roy Welsch
August 8, 2000
MIT Sloan School of Management
Statistical Methods and Applications
Principal Investigator
Roy Welsch
Related Faculty
Hiram M Samel
Senior Lecturer
Prof. Deborah G Ancona
Seley Distinguished Professor of Management
Marc D O'Mansky
Associate Director, Sloan Fellows